low-energy ion spectroscopy

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• Low-energy ion scattering — LEIS redirects here; for the Hawaiian garland see Lei (Hawaii). Low energy ion scattering spectroscopy (LEIS), sometimes referred to simply as ion scattering spectroscopy (ISS), is a surface sensitive analytical technique used to characterize the …   Wikipedia

• Low-energy electron diffraction — (LEED) is a technique used to characterize the structures of surfaces.History =Davisson and Germer s discovery of electron diffraction= The development of electron diffraction was closely linked to the progress of quantum mechanics and atomic… …   Wikipedia

• spectroscopy — spectroscopist /spek tros keuh pist/, n. /spek tros keuh pee, spek treuh skoh pee/, n. the science that deals with the use of the spectroscope and with spectrum analysis. [1865 70; SPECTRO + SCOPY] * * * Branch of analysis devoted to identifying… …   Universalium

• Energy level — A quantum mechanical system or particle that is bound that is, confined spatially can only take on certain discrete values of energy. This contrasts with classical particles, which can have any energy. These discrete values are called energy… …   Wikipedia

• Atomic spectroscopy — is the determination of elemental composition by its electromagnetic or mass spectrum. Atomic spectroscopy is closely related to other forms of spectroscopy. It can be divided by atomization source or by the type of spectroscopy used. In the… …   Wikipedia

• Static secondary ion mass spectrometry — Static secondary ion mass spectrometry, or static SIMS is a technique for chemical analysis including elemental composition and chemical structure of the uppermost atomic or molecular layer of a solid which may be a metal, semiconductor or… …   Wikipedia

• Rutherford backscattering spectroscopy — Rutherford backscattering spectrometry (RBS) is an analytical technique used in materials science. Sometimes referred to as high energy ion scattering (HEIS) spectrometry, RBS is used to determine the structure and composition of materials by… …   Wikipedia

• Auger electron spectroscopy — (AES; Auger pronounced|oːʒeː in French) is a common analytical technique used specifically in the study of surfaces and, more generally, in the area of materials science. Underlying the spectroscopic technique is the Auger effect, as it has come… …   Wikipedia

• Reflection high energy electron diffraction — (RHEED) is a technique used to characterize the surface of crystalline materials. RHEED systems gather information only from the surface layer of the sample, which distinguishes RHEED from other materials characterization methods that rely also… …   Wikipedia

• Focused ion beam — Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor and materials science fields for site specific analysis, deposition, and ablation of materials. The FIB is a scientific instrument that resembles a… …   Wikipedia

• Carbonium ion — CH5 redirects here. For the postal district, see CH postcode area. A carbonium ion is a carbocation of the penta or tetracoordinated nonclassical type such as an ion of the type R5C+.[1] Methanium CH5+ …   Wikipedia